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Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.

Donghee SonGang-Jun KimJongkyun KimNam-Hyun LeeKijin KimSangwoo Pae
Published in: IRPS (2021)
Keyphrases
  • high temperature
  • recovery algorithm
  • main memory
  • high density
  • database
  • database systems
  • data structure