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Effect of DC/AC stress on the reliability of cell capacitor in DRAM.

Gang-Jun KimNam-Hyun LeeJongkyun KimJung Eun SeokYunsung Lee
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • main memory
  • neural network
  • learning algorithm
  • microscopic images
  • highly reliable
  • reliability analysis