Sign in

Degradation of pMOSFETs due to hot electron induced punchthrough.

Donghee SonGang-Jun KimJi-Hoon SeoNam-Hyun LeeYongHa KangBongkoo Kang
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • databases
  • multiresolution
  • real time
  • search engine
  • information systems
  • lower bound
  • color images
  • domain knowledge
  • hot topics
  • high energy