SEQUENTIAL IMPORTANCE SAMPLING
Experts
- Dirk Abel
- Andrey V. Savkin
- Ahmad F. Taha
- Tong Zhou
- Bharat Joshi
- Ryan M. Watson
- Michael Maravgakis
- Anna Scaglione
- Xiao Li
- Jiarong Lin
- Sangwoo Park
- Stylianos Piperakis
- Dimitrios Kanoulas
- Biao Huang
- Jinde Cao
- Maximilian Nitsch
- Da-Wei Gu
- Robert C. Leishman
- Javad Lavaei
- Jonas Latz
- Ioannis M. Rekleitis
- Muhammad Nadeem
- Florian Dörfler
- Roland Siegwart
- Fulvio Forni
- Jean-Sébastien Brouillon
- Elisabeth Ullmann
- David Stenger
- Iason Papaioannou
- Naeem Khan
- Andrew R. Teel
- Panos E. Trahanias
- Jason N. Gross
- Jeffrey L. Krolik
- Ehsan Hashemi
- Luca Zaccarian
- Reza Mohammadi-Ghazi
- Clark N. Taylor
- Fabian Wagner
Venues
- CoRR
- ACC
- ICRA
- IEEE Access
- Neurocomputing
- Autom.
- IEEE Trans. Smart Grid
- ICASSP
- CDC
- IEEE Trans. Veh. Technol.
- Sensors
- IEEE Trans. Autom. Control.
- ASCC
- IEEE Trans. Instrum. Meas.
- Intelligent Vehicles Symposium
- ECC
- IEEE Robotics Autom. Lett.
- J. Frankl. Inst.
- IROS
- Multim. Tools Appl.
- Int. J. Syst. Sci.
- ICARCV
- CCTA
- Comput. Aided Civ. Infrastructure Eng.
- IEEE Trans. Syst. Man Cybern. Part B
- IEEE Trans. Aerosp. Electron. Syst.
- SMC
- GLOBECOM
- ACSSC
- IAS
- ISRR
- RoboCup
- CCA
- Stat. Comput.
- CDC/ECC
- Ind. Robot
- IEEE Instrum. Meas. Mag.
- ICIP
- J. Control. Decis.
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