Sharad C. Seth

Publication Activity (10 Years)

Years Active: 1977-2018
Publications (10 Years): 5

Top Topics

Garbage Collection

Relational Data

Top Venues

Publications

Zhichao Yan, Hong Jiang, Witawas Srisa-an, Sharad C. Seth, Yujuan Tan
Leverage Redundancy in Hardware Transactional Memory to Improve Cache Reliability. ICPP (2018)
Junjie Qian, Hong Jiang, Witawas Srisa-an, Sharad C. Seth, Stan Skelton, Joseph Moore
Energy-efficient I/O Thread Schedulers for NVMe SSDs on NUMA. CCGrid (2017)
Junjie Qian, Witawas Srisa-an, Sharad C. Seth, Hong Jiang, Du Li, Pan Yi
Exploiting FIFO Scheduler to Improve Parallel Garbage Collection Performance. VEE (2016)
David W. Embley, Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth
Converting heterogeneous statistical tables on the web to searchable databases. Int. J. Document Anal. Recognit. 19 (2) (2016)
George Nagy, Sharad C. Seth
Table headers: An entrance to the data mine. ICPR (2016)
George Nagy, David W. Embley, Mukkai S. Krishnamoorthy, Sharad C. Seth
Clustering header categories extracted from web tables. DRR (2015)
Junjie Qian, Witawas Srisa-an, Du Li, Hong Jiang, Sharad C. Seth, Yaodong Yang
SmartStealing: Analysis and Optimization of Work Stealing in Parallel Garbage Collection for Java VM. PPPJ (2015)
Junjie Qian, Du Li, Witawas Srisa-an, Hong Jiang, Sharad C. Seth
Factors affecting scalability of multithreaded Java applications on manycore systems. ISPASS (2015)
David W. Embley, Sharad C. Seth, George Nagy
Transforming Web Tables to a Relational Database. ICPR (2014)
Dongyuan Zhan, Hong Jiang, Sharad C. Seth
CLU: Co-Optimizing Locality and Utility in Thread-Aware Capacity Management for Shared Last Level Caches. IEEE Trans. Computers 63 (7) (2014)
George Nagy, Sharad C. Seth, David W. Embley
End-to-End Conversion of HTML Tables for Populating a Relational Database. Document Analysis Systems (2014)
Sharad C. Seth, George Nagy
Segmenting Tables via Indexing of Value Cells by Table Headers. ICDAR (2013)
Dongyuan Zhan, Hong Jiang, Sharad C. Seth
Locality & utility co-optimization for practical capacity management of shared last level caches. ICS (2012)
David W. Embley, Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth
Factoring Web Tables. IEA/AIE (1) (2011)
George Nagy, Sharad C. Seth, Dongpu Jin, David W. Embley, Spencer Machado, Mukkai S. Krishnamoorthy
Data Extraction from Web Tables: The Devil is in the Details. ICDAR (2011)
Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya
Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects. Asian Test Symposium (2011)
Dongyuan Zhan, Hong Jiang, Sharad C. Seth
STEM: Spatiotemporal Management of Capacity for Intra-core Last Level Caches. MICRO (2010)
Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya
PVT: Unified Reduction of Test Power, Volume, and Test Time Using Double-Tree Scan Architecture. J. Low Power Electron. 6 (3) (2010)
Dongyuan Zhan, Hong Jiang, Sharad C. Seth
Exploiting set-level non-uniformity of capacity demand to enhance CMP cooperative caching. IPDPS (2010)
Zhen Chen, Sharad C. Seth, Dong Xiang
A novel hybrid delay testing scheme with low test power, volume, and time. VTS (2010)
Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya
A Unified Solution to Scan Test Volume, Time, and Power Minimization. VLSI Design (2010)
Nathan Schemm, Sina Balkir, Sharad C. Seth
Hardware implementation of the double-tree scan architecture. ISCAS (2010)
Sharad C. Seth, Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy
Analysis and taxonomy of column header categories for web tables. Document Analysis Systems (2010)
Raghav Krishna Padmanabhan, Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth, William Silversmith
Interactive Conversion of Web Tables. GREC (2009)
George Nagy, Sharad C. Seth, Mahesh Viswanathan
Comment: Projection Methods Require Black Border Removal. IEEE Trans. Pattern Anal. Mach. Intell. 31 (4) (2009)
Ramana Chakradhar Jandhyala, Mukkai S. Krishnamoorthy, George Nagy, Raghav K. Padmanabhan, Sharad C. Seth, William Silversmith
From Tessellations to Table Interpretation. Calculemus/MKM (2009)
Jian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram
Efficient Selection of Observation Points for Functional Tests. ISQED (2008)
Indranil Saha, Bhargab B. Bhattacharya, Sheng Zhang, Sharad C. Seth
Planar Straight-Line Embedding of Double-Tree Scan Architecture on a Rectangular Grid. Fundam. Informaticae 89 (2-3) (2008)
Jian Kang, Sharad C. Seth, Shashank K. Mehta
Symbolic Path Sensitization Analysis and Applications. ATS (2007)
Jian Kang, Sharad C. Seth, Vijay Gangaram
Efficient RTL Coverage Metric for Functional Test Selection. VTS (2007)
Ashutosh Joshi, George Nagy, Daniel P. Lopresti, Sharad C. Seth
A Maximum-Likelihood Approach to Symbolic Indirect Correlation. ICPR (3) (2006)
Daniel P. Lopresti, George Nagy, Sharad C. Seth, Xiaoli Zhang
Multi-character Field Recognition for Arabic and Chinese Handwriting. SACH (2006)
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya
Efficient Test Compaction for Pseudo-Random Testing. Asian Test Symposium (2005)
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design. VLSI Design (2005)
George Nagy, Ashutosh Joshi, Mukkai S. Krishnamoorthy, Yu Lin, Daniel P. Lopresti, Shashank K. Mehta, Sharad C. Seth
A nonparametric classifier for unsegmented text. DRR (2004)
Ashok Samal, Sharad C. Seth, Kevin Cueto
A feature-based approach to conflation of geospatial sources. Int. J. Geogr. Inf. Sci. 18 (5) (2004)
George Nagy, Sharad C. Seth, Shashank K. Mehta, Yu Lin
Indirect Symbolic Correlation Approach to Unsegmented Text Recognition. CVPR Workshops (2003)
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang
Double-Tree Scan: A Novel Low-Power Scan-Path Architecture. ITC (2003)
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang
Low-Energy BIST Design for Scan-based Logic Circuits. VLSI Design (2003)
Hailong Cui, Sharad C. Seth, Shashank K. Mehta
Modeling Fault Coverage of Random Test Patterns. J. Electron. Test. 19 (3) (2003)
Hailong Cui, Sharad C. Seth, Shashank K. Mehta
A Novel Method to Improve the Test Efficiency of VLSI Tests. VLSI Design (2002)
Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr
Design Verification and Functional Testing of FiniteState Machines. VLSI Design (2001)
Don Sylwester, Sharad C. Seth
Adaptive Segmentation of Document Images. ICDAR (2001)
Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu
Integrated text and line-art extraction from a topographic map. Int. J. Document Anal. Recognit. 2 (4) (2000)
Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr
Exploiting don't cares to enhance functional tests. ITC (2000)
Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu
Cooperative Text and Line-Art Extraction from a Topographic Map. ICDAR (1999)
Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth
A synthesis for testability scheme for finite state machines using clock control. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (12) (1999)
Shashank K. Mehta, Sharad C. Seth
Empirical Computation of Reject Ratio in VLSI Testing. VLSI Design (1999)
Vishwani D. Agrawal, Sharad C. Seth
Mutually Disjoint Signals and Probability Calculation in Digital Circuits. Great Lakes Symposium on VLSI (1998)
Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth
Synthesis of Sequential Circuits with Clock Control to Improve Testability. Asian Test Symposium (1998)
George Nagy, Ashok Samal, Sharad C. Seth, T. Fisher, E. Guthmann, K. Kalafala, Luyang Li, Prateek Sarkar, S. Sivasubramaniam, Yihong Xu
A Prototype for Adaptive Association of Street Names with Streets on Maps. GREC (1997)
Yuhong Yu, Ashok Samal, Sharad C. Seth
A system for recognizing a large class of engineering drawings. IEEE Trans. Pattern Anal. Mach. Intell. 19 (8) (1997)
Shashank K. Mehta, Kent L. Einspahr, Sharad C. Seth
Synthesis for Testability by Two-Clock Control. VLSI Design (1997)
Kent L. Einspahr, Sharad C. Seth, Vishwani D. Agrawal
Improving Circuit Testability by Clock Control. Great Lakes Symposium on VLSI (1996)
N. Ranganathan, Sharad C. Seth
Conference Reports. IEEE Des. Test Comput. 12 (2) (1995)
Kent L. Einspahr, Sharad C. Seth
A switch-level test generation system for synchronous and asynchronous circuits. J. Electron. Test. 6 (1) (1995)
Sivaramakrishnan Venkatraman, Sharad C. Seth, Prathima Agrawal
Parallel test generation with low communication overhead. VLSI Design (1995)
Stephen D. Scott, Ashok Samal, Sharad C. Seth
HGA: A Hardware-Based Genetic Algorithm. FPGA (1995)
Don Sylwester, Sharad C. Seth
A trainable, single-pass algorithm for column segmentation. ICDAR (1995)
Yuhong Yu, Ashok Samal, Sharad C. Seth
A system for recognizing a large class of engineering drawings. ICDAR (1995)
Paul Kenyon, Sharad C. Seth, Andrea Clematis, Prathima Agrawal, Gabriella Dodero, Vittoria Gianuzzi
Programming pipelined CAD applications on message-passing architectures. Concurr. Pract. Exp. 7 (4) (1995)
Sharad C. Seth, Lee Gowen, Matt Payne, Don Sylwester
Logic Simulation Using an Asynchronous Parallel Discrete-Event Simulation Model on a SIMD Machine. VLSI Design (1994)
Yuhong Yu, Ashok Samal, Sharad C. Seth
Isolating symbols from connection lines in a class of engineering drawings. Pattern Recognit. 27 (3) (1994)
D. Das, Sharad C. Seth, Vishwani D. Agrawal
Accurate computation of field reject ratio based on fault latency. IEEE Trans. Very Large Scale Integr. Syst. 1 (4) (1993)
Kent L. Einspahr, Sharad C. Seth, Vishwani D. Agrawal
Clock partitioning for testability. Great Lakes Symposium on VLSI (1993)
Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth, Mahesh Viswanathan
Syntactic Segmentation and Labeling of Digitized Pages from Technical Journals. IEEE Trans. Pattern Anal. Mach. Intell. 15 (7) (1993)
Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth
Generating Tests for Delay Faults in Nonscan Circuits. IEEE Des. Test Comput. 10 (1) (1993)
Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth
DynaTAPP: dynamic timing analysis with partial path activation in sequential circuits. EURO-DAC (1992)
George Nagy, Sharad C. Seth, Mahesh Viswanathan
A Prototype Document Image Analysis System for Technical Journals. Computer 25 (7) (1992)
Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth
A New Method for Generating Tests for Delay Faults in Non-Scan Circuits. VLSI Design (1992)
Kent L. Einspahr, Sharad C. Seth
A Switch-Level Test Generation System. VLSI Design (1992)
Dharam Vir Das, Sharad C. Seth, Vishwani D. Agrawal
Estimating the Quality of Manufactured Digital Sequential Circuits. ITC (1991)
Dharam Vir Das, Sharad C. Seth, Paul T. Wagner, John C. Anderson, Vishwani D. Agrawal
An experimental study on reject ratio prediction for VLSI circuits: Kokomo revisited. ITC (1990)
Sharad C. Seth, Vishwani D. Agrawal, Hassan Farhat
A Statistical Theory of Digital Circuit Testability. IEEE Trans. Computers 39 (4) (1990)
Paul Kenyon, Prathima Agrawal, Sharad C. Seth
High-level microprogramming: an optimizing C compiler for a processing element of a CAD accelerator. MICRO (1990)
Raghu V. Hudli, Sharad C. Seth
Testability Analysis of Synchronous Sequential Circuits Based on Structural Data. ITC (1989)
Lester Lipsky, Sharad C. Seth
Signal Probabilities in AND-OR Trees. IEEE Trans. Computers 38 (11) (1989)
Sharad C. Seth, Vishwani D. Agrawal
A new model for computation of probabilistic testability in combinational circuits. Integr. 7 (1) (1989)
Sharad C. Seth, Vishwani D. Agrawal
A new model for computation of probabilistic testability in combinational circuits. Integr. 7 (3) (1989)
Bhargab B. Bhattacharya, Sharad C. Seth
Design of Parity Testable Combinational Circuits. IEEE Trans. Computers 38 (11) (1989)
Wuudiann Ke, Sharad C. Seth, Bhargab B. Bhattacharya
A fast fault simulation algorithm for combinational circuits. ICCAD (1988)
George Nagy, Sharad C. Seth, Kent L. Einspahr
Decoding Substitution Ciphers by Means of Word Matching with Application to OCR. IEEE Trans. Pattern Anal. Mach. Intell. 9 (5) (1987)
Sharad C. Seth
Predicting Fault Coverage from Probabilistic Testability. ITC (1985)
Ten-Chuan Hsiao, Sharad C. Seth
An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing. IEEE Trans. Computers 33 (10) (1984)
Sharad C. Seth, Vishwani D. Agrawal
Characterizing the LSI Yield Equation from Wafer Test Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3 (2) (1984)
Sharad C. Seth, Lester Lipsky
A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems. IEEE Trans. Computers 32 (8) (1983)
Vishwani D. Agrawal, Sharad C. Seth, Prathima Agrawal
LSI product quality and fault coverage. DAC (1981)
Sharad C. Seth, K. Narayanaswamy
A Graph Model for Pattern-Sensitive Faults in Random Access Memories. IEEE Trans. Computers 30 (12) (1981)
Kolar L. Kodandapani, Sharad C. Seth
On Combinational Networks with Restricted Fan-Out. IEEE Trans. Computers 27 (4) (1978)
James M. Steckelberg, Sharad C. Seth
On a Relation Between Algebraic Programs and Turing Machines. Inf. Process. Lett. 6 (6) (1977)
Sharad C. Seth, Kolar L. Kodandapani
Diagnosis of Faults in Linear Tree Networks. IEEE Trans. Computers 26 (1) (1977)