Generating Tests for Delay Faults in Nonscan Circuits.
Prathima AgrawalVishwani D. AgrawalSharad C. SethPublished in: IEEE Des. Test Comput. (1993)
Keyphrases
- power dissipation
- built in self test
- test cases
- fault diagnosis
- fault models
- model based diagnosis
- circuit design
- logic synthesis
- critical path
- analog circuits
- digital circuits
- neural network
- fault detection
- power consumption
- test suite
- statistical tests
- fault detection and diagnosis
- fault model
- delay insensitive
- high speed
- wireless sensor networks
- fault detection and isolation
- information systems