Efficient RTL Coverage Metric for Functional Test Selection.

Jian Kang Sharad C. Seth Vijay Gangaram

Published in: VTS (2007)

Keyphrases

information systems
selection algorithm
test suite
artificial intelligence
mutual information
information redundancy
selection strategy
statistical tests
metric space
cost effective
image quality
databases
semi supervised
knn
feature space
bayesian networks
neural network