Efficient Test Compaction for Pseudo-Random Testing.

Sheng Zhang Sharad C. Seth Bhargab B. Bhattacharya

Published in: Asian Test Symposium (2005)

Keyphrases

pseudorandom
test data
computationally expensive
software testing
random number
test set
cost effective
uniformly distributed
test generation
random numbers
website
data structure
computationally efficient
test cases
test case generation
code coverage