A Novel Method to Improve the Test Efficiency of VLSI Tests.
Hailong CuiSharad C. SethShashank K. MehtaPublished in: VLSI Design (2002)
Keyphrases
- fully automatic
- computational complexity
- objective function
- experimental evaluation
- preprocessing
- theoretical analysis
- computationally efficient
- dynamic programming
- test data
- high precision
- high accuracy
- similarity measure
- detection method
- synthetic data
- classification method
- knn
- classification accuracy
- computational cost
- high efficiency
- pairwise
- highly efficient
- machine learning
- post hoc
- optimization algorithm
- support vector machine svm
- medical images
- mutual information
- high speed
- edge detection
- support vector machine
- probabilistic model
- cost function
- significant improvement