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Exploiting don't cares to enhance functional tests.

Mark W. WeissSharad C. SethShashank K. MehtaKent L. Einspahr
Published in: ITC (2000)
Keyphrases
  • machine learning
  • real time
  • data sets
  • case study
  • multiscale
  • data mining
  • computer vision
  • e learning
  • wide range
  • information technology
  • functional analysis