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Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects.

Zhen ChenSharad C. SethDong XiangBhargab B. Bhattacharya
Published in: Asian Test Symposium (2011)
Keyphrases
  • fault diagnosis
  • model based diagnosis
  • fault detection
  • multiple faults
  • fault model
  • real time
  • information systems
  • fault models
  • database
  • expert systems
  • quality control
  • classical logic
  • fault detection and diagnosis