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PVT: Unified Reduction of Test Power, Volume, and Test Time Using Double-Tree Scan Architecture.

Zhen ChenSharad C. SethDong XiangBhargab B. Bhattacharya
Published in: J. Low Power Electron. (2010)
Keyphrases
  • artificial intelligence
  • knowledge base
  • power consumption
  • database
  • data sets
  • databases
  • feature selection
  • database systems
  • data structure
  • test cases
  • tree structure
  • hierarchical structure
  • software testing