A new model for computation of probabilistic testability in combinational circuits.
Sharad C. SethVishwani D. AgrawalPublished in: Integr. (1989)
Keyphrases
- probabilistic model
- objective function
- computational model
- statistical model
- formal model
- management system
- mathematical model
- case study
- real time
- high speed
- lateral inhibition
- simulation model
- hierarchical structure
- experimental data
- theoretical framework
- cost function
- artificial neural networks
- multi agent systems
- neural network