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A Switch-Level Test Generation System.

Kent L. EinspahrSharad C. Seth
Published in: VLSI Design (1992)
Keyphrases
  • test generation
  • test cases
  • test sequences
  • computer vision
  • static analysis
  • symbolic execution
  • data sets
  • artificial intelligence
  • video sequences
  • open source
  • database applications
  • machine vision
  • software testing