A switch-level test generation system for synchronous and asynchronous circuits.

Kent L. Einspahr Sharad C. Seth

Published in: J. Electron. Test. (1995)

Keyphrases

test generation
high speed
test cases
symbolic execution
static analysis
quality assurance
information systems
software testing
test sequences
regression testing
design automation
machine learning
relational databases
query language
real world
databases
machine vision
data sets
database