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Low-Energy BIST Design for Scan-based Logic Circuits.

Bhargab B. BhattacharyaSharad C. SethSheng Zhang
Published in: VLSI Design (2003)
Keyphrases
  • logic circuits
  • low energy
  • functional decomposition
  • low power
  • minimum energy
  • image processing
  • signal processing
  • building blocks
  • fine grained
  • design methodology
  • electron microscopy
  • gate array