Login / Signup
Parallel test generation with low communication overhead.
Sivaramakrishnan Venkatraman
Sharad C. Seth
Prathima Agrawal
Published in:
VLSI Design (1995)
Keyphrases
</>
communication overhead
test generation
test cases
communication cost
test sequences
symbolic execution
software testing
quality assurance
design automation
static analysis
code coverage
databases
sensor networks
data distribution