A New Method for Generating Tests for Delay Faults in Non-Scan Circuits.

Prathima Agrawal Vishwani D. Agrawal Sharad C. Seth

Published in: VLSI Design (1992)

Keyphrases

test data
optimization algorithm
support vector machine svm
high speed
theoretical analysis
objective function

preprocessing
prior knowledge
cost function
high accuracy
classification accuracy

detection method
synthetic data
feature set
similarity measure
image processing

fully automatic
data sets
clustering method
feature extraction
feature selection