A New Method for Generating Tests for Delay Faults in Non-Scan Circuits.
Prathima AgrawalVishwani D. AgrawalSharad C. SethPublished in: VLSI Design (1992)
Keyphrases
- test data
- optimization algorithm
- support vector machine svm
- high speed
- theoretical analysis
- objective function
- preprocessing
- prior knowledge
- cost function
- high accuracy
- classification accuracy
- detection method
- synthetic data
- feature set
- similarity measure
- image processing
- fully automatic
- data sets
- clustering method
- feature extraction
- feature selection