Improving Circuit Testability by Clock Control.

Kent L. Einspahr Sharad C. Seth Vishwani D. Agrawal

Published in: Great Lakes Symposium on VLSI (1996)

Keyphrases

high speed
duty cycle
control method
computer vision
control system
dc dc converter
software development
real world
learning algorithm
delay insensitive
analog circuits
control theory
control problems
process control
control strategies
adaptive control
database
data acquisition
machine learning
mobile robot