Empirical Computation of Reject Ratio in VLSI Testing.
Shashank K. MehtaSharad C. SethPublished in: VLSI Design (1999)
Keyphrases
- machine learning
- software testing
- multi agent systems
- signal processing
- vlsi implementation
- theoretical analysis
- multiresolution
- efficiently computing
- parallel computation
- efficient computation
- standard deviation
- test cases
- test set
- high speed
- real time
- learning environment
- database systems
- case study
- feature selection
- social networks
- artificial intelligence
- data mining
- databases