Characterizing the LSI Yield Equation from Wafer Test Data.

Sharad C. Seth Vishwani D. Agrawal

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1984)

Keyphrases

test data
training data
test cases
latent semantic indexing
test set
data sets
semiconductor manufacturing
training set
integrated circuit
database
search based testing
training and test data
pairwise
training samples
relational databases
feature space
data mining