LANE DETECTION
Experts
- Fei-Yue Wang
- Nanning Zheng
- Josef Kittler
- Reinhard Klette
- Dongpu Cao
- Mohan M. Trivedi
- Alberto Broggi
- Saïd Mammar
- Markos Papageorgiou
- Chunzhao Guo
- Long Chen
- Christoph Stiller
- Miguel Ángel Sotelo
- Li Li
- Mark B. Sandler
- Luc Van Gool
- Abdesselam Bouzerdoum
- Son Lam Phung
- Ioannis Papamichail
- Fawzi Nashashibi
- Mark S. Nixon
- Chung Choo Chung
- Bing-Fei Wu
- Junmin Wang
- Petros A. Ioannou
- Kazuhito Murakami
- Chen Lv
- Dan Levi
- Alexander Zelinsky
- Yang Li
- Alessandro Corrêa Victorino
- Xiaoxiang Na
- Sebastien Glaser
- John Illingworth
- Zhanyi Hu
- Xiangjing An
- Siyu Teng
- Alois C. Knoll
- Bok-Suk Shin
Venues
- CoRR
- ITSC
- IEEE Trans. Intell. Transp. Syst.
- Intelligent Vehicles Symposium
- Sensors
- IEEE Access
- IEEE Trans. Intell. Veh.
- IV
- Pattern Recognit. Lett.
- IEEE Trans. Veh. Technol.
- IROS
- Pattern Recognit.
- ICRA
- ACC
- ICASSP
- ICPR
- IEEE Intell. Transp. Syst. Mag.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- ICIP
- SMC
- VEHITS
- MVA
- ICCV
- CVPR
- ICARCV
- VTC Fall
- Multim. Tools Appl.
- ICVES
- ICCVE
- Mach. Vis. Appl.
- ECC
- J. Intell. Transp. Syst.
- Expert Syst. Appl.
- VTC Spring
- SIU
- Comput. Vis. Image Underst.
- IEEE Trans. Ind. Electron.
- IEEE Trans. Image Process.
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