Jacques Pinaton

Publication Activity (10 Years)

Years Active: 2010-2022
Publications (10 Years): 28

Top Topics

Product Quality

Semiconductor Manufacturing

Fault Detection

Semantic Retrieval

Top Venues

Publications

Dima El Jamal, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes. ECC (2022)
Dima El Jamal, Mohammed Al-Kharaz, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
Combining Approaches of Brownian Motion and Similarity Principle to Improve the Remaining Useful Life Prediction. ICPHM (2021)
Dima El Jamal, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
Similarity-based Brownian Motion Approach for Remaining Useful Life Prediction. ICCAD (2021)
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry. CDC (2021)
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. ECC (2021)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
A physics-informed Run-to-Run control framework for semiconductor manufacturing. Expert Syst. Appl. 155 (2020)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
A Structure Data-Driven Framework for Virtual Metrology Modeling. IEEE Trans Autom. Sci. Eng. 17 (3) (2020)
Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA. SummerSim (2019)
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing. CDC (2019)
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. CoDIT (2019)
Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
. ICSC (2019)
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process. CASE (2019)
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk. WSC (2018)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco S. Reis, Jacques Pinaton
Virtual Metrology Modeling based on Gaussian Bayesian Network. WSC (2018)
Taki Eddine Korabi, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing. PRIME (2018)
Abdelhak Khemiri, Maâmar El-Amine Hamri, Claudia S. Frydman, Jacques Pinaton
Improving Business Process in semiconductor manufacturing by Discovering Business Rules. WSC (2018)
Karim Tamssaouet, Stéphane Dauzère-Pérès, Claude Yugma, Sebastian Knopp, Jacques Pinaton
A Study on the Integration of Complex Machines in Complex Job shop Scheduling. WSC (2018)
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
Analysis of similarities between alarm events in the semiconductor manufacturing process. MED (2017)
Ali Ben-Salem, Claude Yugma, Emmanuel Troncet, Jacques Pinaton
A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility. WSC (2017)
Tiago J. Rato, Jakey Blue, Jacques Pinaton, Marco S. Reis
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 14 (2) (2017)
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton
Product quality prediction using alarm data : Application to the semiconductor manufacturing process. MED (2017)
M. A. Jebri, Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
Virtual metrology on Chemical Mechanical Planarization process based on Just-In-Time Learning. ICSC (2016)
Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
Online optimized parameters for RLS-LT controller - application to processes with mixed products and feature aging. ICSC (2016)
Guillaume Graton, El Mostafa El Adel, Mustapha Ouladsine, Jacques Pinaton
Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging. MED (2016)
Jakey Blue, Agnès Roussy, Jacques Pinaton
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing. WSC (2016)
Julien Marino, Francesco Rossi, Mustapha Ouladsine, Jacques Pinaton
Gaussian Time Error: A new index for fault detection in semiconductor processes. ACC (2016)
El Mostafa El Adel, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton
Run To Run control based on categorical output in semiconductor manufacturing. ICSC (2016)
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
Regularized regression models to predict the product quality in multistep manufacturing. ICSC (2016)
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton
Defect diagnosis using in line product control data in semiconductor industry. ICSC (2015)
Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
Optimized allocation of defect inspection capacity with a dynamic sampling strategy. Comput. Oper. Res. 53 (2015)
Alejandro Sendón, Stéphane Dauzère-Pérès, Jacques Pinaton
Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. WSC (2015)
Thi-Bich-Lien Nguyen, Mohand Djeziri, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
Degradation modelling with operating mode changes. ICPHM (2015)
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics. ICEIS (1) (2014)
Sylvain Housseman, Stéphane Dauzère-Pérès, Gloria Rodríguez-Verján, Jacques Pinaton
Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing. CASE (2014)
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton
Similar sample selection approach based on sequence alignment; application to semiconductor industry. MED (2014)
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
A semantic support to improve the collaborative control of manufacturing processes in industries. CSCWD (2013)
Sara Bouzid, Corine Cauvet, Claudia S. Frydman, Jacques Pinaton
A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study. MIM (2013)
Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès, Sylvain Housseman, Jacques Pinaton
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing. WSC (2013)
Alexis Thieullen, Mustapha Ouladsine, Jacques Pinaton
Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment. ECC (2013)
Sara Bouzid, Corine Cauvet, Jacques Pinaton
A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control. ICEIS (2) (2012)
Sara Bouzid, Corine Cauvet, Jacques Pinaton
A survey of semantic web standards to representing knowledge in problem solving situations. CAMP (2012)
Pamela Viale, Norbert Giambiasi, Claudia S. Frydman, Jacques Pinaton
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP). SpringSim (TMS-DEVS) (2012)
Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
A mathematical model for estimating defect inspection capacity with a dynamic control strategy. WSC (2012)
Gloria Rodríguez-Verján, Eric Tartiere, Jacques Pinaton, Stéphane Dauzère-Pérès, Alexis Thieullen
Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing. CASE (2012)
Claude Yugma, Stéphane Dauzère-Pérès, Jean-Loup Rouveyrol, Philippe Vialletelle, Jacques Pinaton, Christophe Relliaud
A smart sampling scheduling and skipping simulator and its evaluation on real data sets. WSC (2011)
Gloria Rodríguez-Verján, Stéphane Dauzère-Pérès, Jacques Pinaton
Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing. WSC (2011)
Pamela Viale, Claudia S. Frydman, Jacques Pinaton
New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge. AICCSA (2011)
Pamela Viale, Claudia S. Frydman, Jacques Pinaton
Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes. SpringSim (TMS-DEVS) (2011)
Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton
Modeling Large Scale Manufacturing Process from Timed Data - Using the TOM4L Approach and Sequence Alignment Information for Modeling STMicroelectronics' Production Processes. ICEIS (2) (2010)
Pamela Viale, Nabil Benayadi, Marc Le Goc, Jacques Pinaton
Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes. ICSOFT (1) (2010)