Gaussian Time Error: A new index for fault detection in semiconductor processes.
Julien MarinoFrancesco RossiMustapha OuladsineJacques PinatonPublished in: ACC (2016)
Keyphrases
- fault detection
- industrial processes
- fault identification
- fault diagnosis
- fault detection and isolation
- tennessee eastman
- condition monitoring
- rotating machinery
- fault detection and diagnosis
- robust fault detection
- fuel cell
- failure detection
- fault localization
- gas turbine
- underwater vehicles
- fault isolation
- taylor series expansion
- search algorithm
- machine learning
- error detection
- complex systems