Jakey Blue

Publication Activity (10 Years)

Years Active: 2009-2021
Publications (10 Years): 12

Top Topics

Fingerprint Verification

Fault Diagnosis

Semiconductor Manufacturing

Top Venues

IEEE Trans Autom. Sci. Eng.

Int. J. Intell. Syst.

Publications

Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing. Int. J. Intell. Syst. 36 (6) (2021)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
A physics-informed Run-to-Run control framework for semiconductor manufacturing. Expert Syst. Appl. 155 (2020)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis
A Structure Data-Driven Framework for Virtual Metrology Modeling. IEEE Trans Autom. Sci. Eng. 17 (3) (2020)
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing. CASE (2018)
Aabir Chouichi, Jakey Blue, Claude Yugma, François Pasqualini
The Detection and the control of Machine/Chamber Mismatching in Semiconductormanufacturing. WSC (2018)
Wei-Ting Yang, Jakey Blue, Agnès Roussy, Marco S. Reis, Jacques Pinaton
Virtual Metrology Modeling based on Gaussian Bayesian Network. WSC (2018)
Hamideh Rostami, Jakey Blue, Claude Yugma
Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data. Appl. Soft Comput. 68 (2018)
Yu-Ting Kao, Stéphane Dauzère-Pérès, Jakey Blue, Shi-Chung Chang
Impact of integrating equipment health in production scheduling for semiconductor fabrication. Comput. Ind. Eng. 120 (2018)
Tiago J. Rato, Jakey Blue, Jacques Pinaton, Marco S. Reis
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 14 (2) (2017)
Jakey Blue, Agnès Roussy, Jacques Pinaton
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing. WSC (2016)
Hamideh Rostami, Jakey Blue, Claude Yugma
Equipment Condition Diagnosis and Fault Fingerprint Extraction in Semiconductor Manufacturing. ICMLA (2016)
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Ali Obeid
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook. J. Sched. 18 (2) (2015)
Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Philippe Vialletelle
Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook. CASE (2014)
Jakey Blue, Argon Chen
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations. IEEE Trans Autom. Sci. Eng. 8 (1) (2011)
Argon Chen, Sean Hsueh, Jakey Blue
Optimum sampling for track PEB CD Integrated Metrology. CASE (2009)