Argon Chen

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 7

Top Topics

Semiconductor Manufacturing

Discrete Event Simulation

Active Contour Segmentation

Quantitative Methods

Top Venues

Pattern Recognit.

Int. J. Intell. Syst.

Comput. Oper. Res.

Publications

Huanze Zeng, Argon Chen
Multivariate multi-layer classifier. Pattern Recognit. 131 (2022)
Zixin Shen, Amos Hong, Argon Chen
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters. Adv. Eng. Informatics 48 (2021)
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing. Int. J. Intell. Syst. 36 (6) (2021)
Huanze Zeng, Argon Chen
Binary multi-layer classifier. Inf. Sci. 562 (2021)
Zixin Shen, Argon Chen
Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysis. Knowl. Based Syst. 203 (2020)
Huanze Zeng, Argon Chen
Classification Tree with Hybrid Splitting Mechanism. SISY (2019)
Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing. CASE (2018)
Lars Mönch, Argon Chen, Myoungsoo (Andy) Ham, James Morrison
Applications of quantitative methods in semiconductor manufacturing. Comput. Oper. Res. 53 (2015)
Ling-Ying Chiu, Argon Chen
A variance-reduction method for thyroid nodule boundary detection on ultrasound images. CASE (2014)
Amos Hong, Argon Chen
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis. WSC (2012)
Jakey Blue, Argon Chen
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations. IEEE Trans Autom. Sci. Eng. 8 (1) (2011)
Argon Chen, Sean Hsueh, Jakey Blue
Optimum sampling for track PEB CD Integrated Metrology. CASE (2009)
Mark W. Brantley, Loo Hay Lee, Chun-Hung Chen, Argon Chen
Optimal sampling in design of experiment for simulation-based stochastic optimization. CASE (2008)
Argon Chen, Elsayed A. Elsayed
Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes. Technometrics 44 (4) (2002)