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From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry.

Mohammed Al-KharazBouchra AnanouMustapha OuladsineMichel CombalJacques Pinaton
Published in: ECC (2021)
Keyphrases
  • quality control
  • product quality
  • data sets
  • artificial intelligence
  • event detection
  • product development
  • real time
  • genetic algorithm
  • life cycle
  • human activities
  • quality assessment
  • process control