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Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing.
Sylvain Housseman
Stéphane Dauzère-Pérès
Gloria Rodríguez-Verján
Jacques Pinaton
Published in:
CASE (2014)
Keyphrases
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semiconductor manufacturing
discrete event simulation
process control
production system
dynamic environments
random sampling
real time
genetic algorithm
early warning
data structure
risk factors
risk analysis
sampling strategies