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A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing.

Taki Eddine KorabiGuillaume GratonEl Mostafa El AdelMustapha OuladsineJacques Pinaton
Published in: PRIME (2018)
Keyphrases
  • semiconductor manufacturing
  • data driven
  • databases
  • search engine
  • social networks
  • bayesian networks
  • video sequences
  • digital libraries
  • expert systems
  • multiresolution
  • bayesian learning