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Analysis of similarities between alarm events in the semiconductor manufacturing process.

Mariam MelhemBouchra AnanouMustapha OuladsineMichel CombalJacques Pinaton
Published in: MED (2017)
Keyphrases
  • manufacturing process
  • reinforcement learning
  • data analysis
  • information technology
  • domain knowledge
  • manufacturing systems
  • quality control
  • case study