Ondrej Novák

Publication Activity (10 Years)

Years Active: 1988-2023
Publications (10 Years): 18

Top Topics

Search Strategy

Data Compression

Error Correction

Statistical Tests

Top Venues

Microprocess. Microsystems

Microelectron. Reliab.

Publications

Ondrej Novák
Deterministic Search Strategy of Compression Codes. DSD (2023)
Ondrej Novák
Nonlinear compression block codes: Exact and random search strategy. Microprocess. Microsystems 101 (2023)
Ondrej Novák
Nonlinear Compression Block Codes Search Strategy. DSD (2022)
Ondrej Novák
Search Strategy of Large Nonlinear Block Codes. DSD (2021)
Ondrej Novák, Martin Rozkovec, Jan Plíva
Decompressors using nonlinear codes. Microprocess. Microsystems 76 (2020)
Ondrej Novák, Martin Rozkovec, Jan Plíva
Combinational Decompressors with Nonlinear Codes. DSD (2019)
Ondrej Novák, Kamila K. Konopinska, Mark E. Meyerhoff, Richard B. Brown
Portable Bluetooth Microsystem for Electrochemically Modulated Nitric Oxide-Releasing Catheters. BioCAS (2019)
Ondrej Novák
Nonlinear Compression Codes Used In IC Testing. DDECS (2019)
Zoran Stamenkovic, Alberto Bosio, György Cserey, Ondrej Novák, Witold A. Pleskacz, Lukás Sekanina, Andreas Steininger, Goran Stojanovic, Viera Stopjaková
International Symposium on Design and Diagnostics of Electronic Circuits and Systems. ITC (2019)
Ondrej Novák
Test Compression Using Extended Nonlinear Binary Codes. IOLTS (2018)
Ondrej Novák, Zdenek Plíva
Test response compaction method with improved detection and diagnostic abilities. Microelectron. Reliab. 80 (2018)
Zoran Stamenkovic, Ondrej Novák, Witold A. Pleskacz
Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017). Microelectron. Reliab. 81 (2018)
Ondrej Novák, Zdenek Plíva
Logic testing with test-per-clock pattern loading and improved diagnostic abilities. DDECS (2017)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
Sequential Test Decompressors with Fast Tester Bits Wide-Spreading. J. Circuits Syst. Comput. 26 (8) (2017)
Ondrej Novák
Extended binary nonlinear codes and their application in testing and compression. ETS (2017)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
Sequential test decompressors with fast variable wide spreading. DDECS (2016)
Ondrej Novák, Richard B. Brown
An empirical model of UWB large-scale signal fading in neocortical research. ISCAS (2016)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
Test Decompressor Effectivity Improvement. DSD (2016)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
LFSR Reseeding Based Test Compression Respecting Different Controllability of Decompressor Outputs. DDECS (2015)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
Test compression for circuits with multiple scan chains. LATS (2015)
Markéta Tomková, Jakub Tomek, Ondrej Novák, Ondrej Zelenka, Josef Syka, Cyril Brom
Formation and disruption of tonotopy in a large-scale model of the auditory cortex. J. Comput. Neurosci. 39 (2) (2015)
Tomas Drahonovsky, Martin Rozkovec, Ondrej Novák
A highly flexible reconfigurable system on a Xilinx FPGA. ReConFig (2014)
Ondrej Novák, Jiri Jenícek, Martin Rozkovec
Test-data compression with low number of channels and short test time. DDECS (2014)
Tomas Drahonovsky, Martin Rozkovec, Ondrej Novák
Relocation of reconfigurable modules on Xilinx FPGA. DDECS (2013)
Martin Chloupek, Jiri Jenícek, Ondrej Novák, Martin Rozkovec
Test pattern decompression in parallel scan chain architecture. DDECS (2013)
Martin Rozkovec, Jiri Jenícek, Ondrej Novák
An evaluation of the application dependent FPGA test method. DDECS (2012)
Martin Chloupek, Ondrej Novák, Jiri Jenícek
On test time reduction using pattern overlapping, broadcasting and on-chip decompression. DDECS (2012)
Jiri Jenícek, Ondrej Novák, Martin Chloupek
Advanced scan chain configuration method for broadcast decompressor architecture. EWDTS (2011)
Jiri Jenícek, Martin Rozkovec, Ondrej Novák
Test vector overlapping based compression tool for narrow test access mechanism. DDECS (2011)
Martin Chloupek, Ondrej Novák
Scan chain configuration method for broadcast decompressor architecture. LATW (2011)
Jiri Jenícek, Ondrej Novák
COMPAS - Advanced test compressor. EWDTS (2010)
Martin Rozkovec, Jiri Jenícek, Ondrej Novák
Application dependent FPGA testing method using compressed deterministic test vectors. IOLTS (2010)
Jan Balach, Ondrej Novák
Reconfigurable Fault-Tolerant System Sychronization. DSD (2010)
Martin Rozkovec, Jiri Jenícek, Ondrej Novák
Application Dependent FPGA Testing Method. DSD (2010)
Martin Rozkovec, Ondrej Novák
Structural test of programmed FPGA circuits. DDECS (2009)
Jiri Jenícek, Ondrej Novák
Test Pattern Compression Based on Pattern Overlapping. DDECS (2007)
Leos Kafka, Martin Danek, Ondrej Novák
A Novel Emulation Technique that Preserves Circuit Structure and Timing. SoC (2007)
Mitra Subhasish, Ondrej Novák, Hana Kubátová, Bashir M. Al-Hashimi, Erik Jan Marinissen, C. P. Ravikumar
Conference Reports. IEEE Des. Test Comput. 23 (4) (2006)
Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. DFT (2006)
Martin Stáva, Ondrej Novák
Using Conflict-Based On-line Learning to Accelerate the Backtrace Algorithm Implemented in HW. DSD (2006)
Leos Kafka, Ondrej Novák
FPGA-based Fault Simulator. DDECS (2006)
Martin Stáva, Ondrej Novák
HW Implementation of the Backtrace Algorithm with Conflict-Driven Dynamic Reconfiguration. DDECS (2006)
Ondrej Novák, Jirí Zahrádka, Zdenek Plíva
COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. EDCC (2005)
Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electron. Test. 20 (1) (2004)
Ondrej Novák
Comparison of Test Pattern Decompression Techniques. DATE (2003)
Ondrej Novák, Jiri Nosek
Test-per-Clock Testing of the Circuits with Scan. IOLTW (2001)
Ondrej Novák, Jiri Nosek
Test Pattern Decompression Using a Scan Chain. DFT (2001)
Ondrej Novák, Jiri Nosek
On Using Deterministic Test Sets in BIST. IOLTW (2000)
Ondrej Novák
Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata. EDCC (1999)
P. Golan, Ondrej Novák, Jan Hlavicka
Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage. IEEE Trans. Computers 37 (4) (1988)