Test pattern decompression in parallel scan chain architecture.
Martin ChloupekJiri JenícekOndrej NovákMartin RozkovecPublished in: DDECS (2013)
Keyphrases
- distributed processing
- parallel architecture
- management system
- level parallelism
- pattern matching
- master slave
- multi processor
- compression scheme
- image compression
- parallel processing
- compression ratio
- parallel implementation
- statistical tests
- processing elements
- parallel computers
- massively parallel
- network architecture
- associative memory
- pattern discovery
- data compression
- real time
- multi core processors
- pipelined architecture
- parallel programming
- distributed memory
- processing units
- genetic algorithm
- neural network