Application Dependent FPGA Testing Method.
Martin RozkovecJiri JenícekOndrej NovákPublished in: DSD (2010)
Keyphrases
- prior knowledge
- experimental evaluation
- application dependent
- synthetic data
- detection method
- high accuracy
- segmentation method
- error rate
- test data
- high precision
- cost function
- fully automatic
- real time
- objective function
- detection algorithm
- matching algorithm
- optimization method
- digital signal
- clustering method
- support vector machine svm
- model selection
- support vector machine
- preprocessing
- image sequences
- data sets