APPLICATION DEPENDENT
Experts
- Mehdi Baradaran Tahoori
- T. Nandha Kumar
- Fabrizio Lombardi
- Haider A. F. Almurib
- Victor Venturi
- Waleed Alkohlani
- Ricardo A. Velásquez
- Holden Parks
- Jiri Jenícek
- Martin Rozkovec
- Zeeshan Ahmad
- Andrzej Krasniewski
- Ondrej Novák
- Venkatasubramanian Viswanathan
- Tong-Chern Ong
- Alessandro Cilardo
- Jeanine E. Cook
- Pierre Michaud
- Jack Yuan-Chen Sun
- Mi-Chang Chang
- André Seznec
- Friedhelm Schwenker
- Mateo Valero
- Yuta Yamato
- David Prat
- Marc Chevaldonné
- Frédéric Mérienne
- Mark Stevenson
- Tong Jing
- Jeffrey T. Kreulen
- Rainer Hammwöhner
- Carlos H. Diaz
- Mottaqiallah Taouil
- Suchismita Roy
- Wolfgang Hohl
- Michael Ullmann
- Lei He
- A. Hein
- François Guillaume
Venues
- IEEE Trans. Very Large Scale Integr. Syst.
- FPGA
- IEEE Trans. Computers
- CoRR
- ICCD
- CICC
- Mach. Learn. Sci. Technol.
- DATE
- SC Companion
- ICC
- PDP
- EUROMICRO
- International Conference on Supercomputing
- IEEE Trans. Pattern Anal. Mach. Intell.
- DFT
- DAC
- ITC
- PROPOR
- Multim. Tools Appl.
- IPDPS
- PMBS@SC
- Int. J. Parallel Program.
- ICSAMOS
- Inf. Process. Manag.
- EUROSPEECH
- IEEE Trans. Parallel Distributed Syst.
- EGVE
- DSD
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DDECS
- IEEE Access
- NODALIDA
- J. Syst. Archit.
- Microprocess. Microsystems
- FPL
- Asian Test Symposium
- AVEC@MM
- EUSIPCO
- Software Development Environments and CASE Technology
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