APPLICATION DEPENDENT
Experts
- Mehdi Baradaran Tahoori
- Fabrizio Lombardi
- T. Nandha Kumar
- Haider A. F. Almurib
- Alessandro Cilardo
- Tong-Chern Ong
- Venkatasubramanian Viswanathan
- André Seznec
- Jeanine E. Cook
- Pierre Michaud
- Jack Yuan-Chen Sun
- Mi-Chang Chang
- Holden Parks
- Ricardo A. Velásquez
- Waleed Alkohlani
- Victor Venturi
- Andrzej Krasniewski
- Ondrej Novák
- Martin Rozkovec
- Jiri Jenícek
- Zeeshan Ahmad
- Teng Lin
- A. Klausmann
- David M. Ogle
- Naehyuck Chang
- Silvio Ricardo Rodrigues Sanches
- Liang Zhou
- Shukla Banik
- Françoise Emerard
- Marc Rittberger
- Baoyu Zheng
- C. H. Diaz
- Marco Raspa
- Michel Dureigne
- Kazumi Hatayama
- Touradj Ebrahimi
- Mauro Olivieri
- Stefan Cosemans
- Maria das Graças Volpe Nunes
Venues
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Computers
- FPGA
- CoRR
- ICCD
- IEEE Trans. Ind. Informatics
- DATE
- Mach. Learn. Sci. Technol.
- CICC
- International Conference on Supercomputing
- EUROMICRO
- PDP
- SC Companion
- ICC
- PROPOR
- DAC
- ITC
- IEEE Trans. Pattern Anal. Mach. Intell.
- DFT
- IPDPS
- PMBS@SC
- Int. J. Parallel Program.
- Multim. Tools Appl.
- IEEE Trans. Parallel Distributed Syst.
- EGVE
- EUROSPEECH
- Inf. Process. Manag.
- DSD
- ICSAMOS
- J. Syst. Archit.
- Microprocess. Microsystems
- Asian Test Symposium
- NODALIDA
- AVEC@MM
- IEEE Access
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DDECS
- Software Development Environments and CASE Technology
- EUSIPCO
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