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Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.

Ondrej NovákZdenek PlívaJiri NosekAndrzej HlawiczkaTomasz GarbolinoKrzysztof Gucwa
Published in: J. Electron. Test. (2004)
Keyphrases
  • built in self test
  • data mining
  • logic programming
  • test data
  • learning algorithm
  • search engine
  • image sequences