Zdenek Plíva

Publication Activity (10 Years)

Years Active: 2004-2020
Publications (10 Years): 4

Top Topics

Parameter Values

Measurement Data

Top Venues

Microprocess. Microsystems

Publications

Martin Hunek, Zdenek Plíva
Detection of NAT64/DNS64 by SRV Records: Detection Using Global DNS Tree in the World Beyond Plain-Text DNS. CN (2020)
Ondrej Novák, Zdenek Plíva
Test response compaction method with improved detection and diagnostic abilities. Microelectron. Reliab. 80 (2018)
Ondrej Novák, Zdenek Plíva
Logic testing with test-per-clock pattern loading and improved diagnostic abilities. DDECS (2017)
Martin Hunek, Zdenek Plíva
Design and optimisation of NiTi pressure gauge. DDECS (2017)
Petr Pfeifer, Zdenek Plíva, Pieter Weckx, Ben Kaczer
On reliability enhancement using adaptive core voltage scaling and variations on nanoscale FPGAs. LATW (2014)
Petr Pfeifer, Zdenek Plíva
A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices. Microprocess. Microsystems 38 (6) (2014)
Petr Pfeifer, Zdenek Plíva
On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA). FPL (2013)
Petr Pfeifer, Zdenek Plíva, Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus
On performance estimation of a scalable VLIW soft-core in XILINX FPGAs. DDECS (2013)
Petr Pfeifer, Zdenek Plíva
On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults. FPL (2012)
Ondrej Novák, Zdenek Plíva, Jiri Jenícek, Zbynek Mader, Michal Jarkovský
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead. DFT (2006)
Ondrej Novák, Jirí Zahrádka, Zdenek Plíva
COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. EDCC (2005)
Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electron. Test. 20 (1) (2004)