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On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults.

Petr PfeiferZdenek Plíva
Published in: FPL (2012)
Keyphrases
  • design parameters
  • design process
  • parameter values
  • design space
  • real time
  • user interface
  • fault diagnosis
  • probabilistic model
  • single chip