Logic testing with test-per-clock pattern loading and improved diagnostic abilities.
Ondrej NovákZdenek PlívaPublished in: DDECS (2017)
Keyphrases
- test cases
- software testing
- test data
- statistical tests
- test sequences
- test generation
- test suite
- test case generation
- high speed
- modal logic
- diagnostic tests
- set of test cases
- real time
- testing process
- automated reasoning
- logic programming
- pattern languages
- classical logic
- associative memory
- first order logic
- pattern detection
- statistically significant
- test data generation
- expert systems
- code coverage
- data sets