A new method for in situ measurement of parameters and degradation processes in modern nanoscale programmable devices.
Petr PfeiferZdenek PlívaPublished in: Microprocess. Microsystems (2014)
Keyphrases
- clustering method
- parameter space
- high precision
- pairwise
- classification method
- experimental evaluation
- parameter estimation
- objective function
- detection method
- segmentation method
- significant improvement
- general purpose
- computational cost
- evolutionary algorithm
- image processing
- least squares
- parameter values
- markov random field
- low cost
- high accuracy
- data sets
- probabilistic model
- cost function
- computational complexity
- multiscale
- neural network