Application dependent FPGA testing method using compressed deterministic test vectors.
Martin RozkovecJiri JenícekOndrej NovákPublished in: IOLTS (2010)
Keyphrases
- test data
- preprocessing
- clustering method
- significant improvement
- experimental evaluation
- feature selection
- synthetic data
- high accuracy
- real time
- dynamic programming
- cost function
- digital signal
- input data
- wavelet transform
- prior knowledge
- artificial neural networks
- data structure
- training data
- genetic algorithm
- data sets