An evaluation of the application dependent FPGA test method.
Martin RozkovecJiri JenícekOndrej NovákPublished in: DDECS (2012)
Keyphrases
- high accuracy
- significant improvement
- fully automatic
- application dependent
- experimental evaluation
- detection method
- optimization method
- test data
- evaluation model
- evaluation method
- cost function
- edge detection
- feature set
- hardware implementation
- high precision
- segmentation method
- synthetic data
- model selection
- real time
- high speed
- low cost
- classification accuracy
- pairwise
- similarity measure
- image segmentation
- data sets