Paolo Pavan

Publication Activity (10 Years)

Years Active: 1993-2024
Publications (10 Years): 35

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Publications

Davide Florini, Daniela Gandolfi, Jonathan Mapelli, Lorenzo Benatti, Paolo Pavan, Francesco Maria Puglisi
A Hybrid CMOS-Memristor Spiking Neural Network Supporting Multiple Learning Rules. IEEE Trans. Neural Networks Learn. Syst. 35 (4) (2024)
Pierangelo Maria Rapa, Mattia Orlandi, Andrea Amidei, Alessio Burrello, Roberto Rabbeni, Paolo Pavan, Luca Benini, Simone Benatti
Driving Towards Safety: Online PPG-based Drowsiness Detection with TCNs. AICAS (2024)
Nicolò Zagni, Francesco Maria Puglisi, Paolo Pavan, Muhammad Ashraful Alam
-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges. Proc. IEEE 111 (2) (2023)
Andrea Amidei, Pierangelo Maria Rapa, Giuseppe Tagliavini, Roberto Rabbeni, Paolo Pavan, Simone Benatti
ANGELS - Smart Steering Wheel for Driver Safety. IWASI (2023)
Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs. IRPS (2023)
Andrea Amidei, Susanna Spinsante, Grazia Iadarola, Simone Benatti, Federico Tramarin, Paolo Pavan, Luigi Rovati
Driver Drowsiness Detection: A Machine Learning Approach on Skin Conductance. Sensors 23 (8) (2023)
Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi
Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide. ESSDERC (2022)
Andrea Amidei, Angelica Poli, Grazia Iadarola, Federico Tramarin, Paolo Pavan, Susanna Spinsante, Luigi Rovati
Driver Drowsiness Detection based on Variation of Skin Conductance from Wearable Device. MetroAutomotive (2022)
Raffaele De Rose, Tommaso Zanotti, Francesco Maria Puglisi, Felice Crupi, Paolo Pavan, Marco Lanuzza
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing. CoRR (2022)
Angelica Poli, Andrea Amidei, Simone Benatti, Grazia Iadarola, Federico Tramarin, Luigi Rovati, Paolo Pavan, Susanna Spinsante
Exploiting Blood Volume Pulse and Skin Conductance for Driver Drowsiness Detection. HealthyIoT (2022)
Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi
The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena. IRPS (2022)
Lorenzo Benatti, Paolo Pavan, Francesco Maria Puglisi
Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions. IRPS (2022)
Tommaso Zanotti, Paolo Pavan, Francesco Maria Puglisi
Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model. ESSDERC (2022)
Francesco Maria Puglisi, Tommaso Zanotti, Paolo Pavan
Optimized Synthesis Method for Ultra-Low Power Multi-Input Material Implication Logic With Emerging Non-Volatile Memories. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (11) (2021)
Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan
Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories. IRPS (2021)
Andrea Amidei, Piero Giorgio Fallica, Sabrina Conoci, Paolo Pavan
Validating Photoplethysmography (PPG) data for driver drowsiness detection. MetroAutomotive (2021)
Marcello Cioni, Alessandro Bertacchini, Alessandro Mucci, Giovanni Verzellesi, Paolo Pavan, Alessandro Chini
Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs. IRPS (2021)
Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan
Smart Logic-in-Memory Architecture For Ultra-Low Power Large Fan-In Operations. AICAS (2020)
Nicolò Zagni, Alessandro Chini, Francesco Maria Puglisi, Paolo Pavan, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Giovanni Verzellesi
Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs. IRPS (2020)
Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan
Reconfigurable Smart In-Memory Computing Platform Supporting Logic and Binarized Neural Networks for Low-Power Edge Devices. IEEE J. Emerg. Sel. Topics Circuits Syst. 10 (4) (2020)
Tommaso Zanotti, Francesco Maria Puglisi, Paolo Pavan
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise. IRPS (2020)
Aleix Lafita, Spencer Bliven, Andreas Prlic, Dmytro Guzenko, Peter W. Rose, Anthony R. Bradley, Paolo Pavan, Douglas Myers-Turnbull, Yana Valasatava, Michael L. Heuer, Matt Larson, Stephen K. Burley, Jose M. Duarte
BioJava 5: A community driven open-source bioinformatics library. PLoS Comput. Biol. 15 (2) (2019)
Francesco Maria Puglisi, Tommaso Zanotti, Paolo Pavan
SIMPLY: Design of a RRAM-Based Smart Logic-in-Memory Architecture using RRAM Compact Model. ESSDERC (2019)
Francesco Maria Puglisi, Lorenzo Pacchioni, Nicolo Zagni, Paolo Pavan
Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model. ESSDERC (2018)
Alessandro Bertacchini, Paolo Pavan
An Ultra-Low Cost Triboelectric Flowmeter. ApplePies (2018)
Alessandro Bertacchini, Marco Lasagni, Gabriele Sereni, Luca Larcher, Paolo Pavan
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting. IECON (2018)
Francesco Maria Puglisi, Nicolo Zagni, Luca Larcher, Paolo Pavan
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design. ESSDERC (2017)
Nicolo Zagni, Francesco Maria Puglisi, Giovanni Verzellesi, Paolo Pavan
Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective. PATMOS (2017)
Luca Larcher, Francesco Maria Puglisi, Andrea Padovani, Luca Vandelli, Paolo Pavan
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. PATMOS (2016)
Marco Lasagni, Paolo Pavan, Alessandro Bertacchini, Luca Larcher
Force impact effect in contact-mode triboelectric energy harvesters: Characterization and modeling. IEEE SENSORS (2016)
Francesco Maria Puglisi, Paolo Pavan
Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices. IEEE Trans. Instrum. Meas. 65 (6) (2016)
Francesco Maria Puglisi, Felipe Costantini, Ben Kaczer, Luca Larcher, Paolo Pavan
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization. ESSDERC (2016)
Luca Larcher, Francesco Maria Puglisi, Andrea Padovani, Luca Vandelli, Paolo Pavan
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. PATMOS (2016)
Francesco Maria Puglisi, Luca Larcher, Andrea Padovani, Paolo Pavan
: Physics, Compact Modeling, and Variability Control. IEEE J. Emerg. Sel. Topics Circuits Syst. 6 (2) (2016)
Alessandro Bertacchini, Giacomantonio Napoletano, Stefano Scorcioni, Luca Larcher, Paolo Pavan
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements. IEEE Trans. Intell. Transp. Syst. 17 (12) (2016)
Francesco Maria Puglisi, Luca Larcher, Andrea Padovani, Paolo Pavan
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory. ESSDERC (2015)
Francesco Maria Puglisi, Paolo Pavan, Luca Vandelli, Andrea Padovani, Matteo Bertocchi, Luca Larcher
A microscopic physical description of RTN current fluctuations in HfOx RRAM. IRPS (2015)
Alessandro Bertacchini, Stefano Scorcioni, Luca Larcher, Giacomantonio Napoletano, Paolo Pavan
Active safety system with RF energy harvesting capabilities for industrial applications using interchangeable implements. IECON (2014)
Mattia Borgarino, Giovanni Betti Beneventi, Valerio Doga, Paolo Pavan
On the limitations of transimpedance amplifiers as tools for low-frequency noise characterization. Microelectron. J. 45 (2) (2014)
Francesco Maria Puglisi, Paolo Pavan, Luca Larcher, Andrea Padovani
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS. ESSDERC (2014)
Francesco Maria Puglisi, Paolo Pavan, Andrea Padovani, Luca Larcher
A compact model of hafnium-oxide-based resistive random access memory. ICICDT (2013)
Francesco Maria Puglisi, Paolo Pavan, Andrea Padovani, Luca Larcher
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS. ESSDERC (2013)
Andrea Padovani, Luca Larcher, Paolo Pavan
Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations. Microelectron. J. 44 (1) (2013)
Denis Dondi, Alessandro Bertacchini, Stefano Scorcioni, Luca Larcher, Paolo Pavan
Enhancing safety in vehicles with implement or trailer using an autonomous wireless sensor network system. ICVES (2012)
Francesco Maria Puglisi, Paolo Pavan, Andrea Padovani, Luca Larcher, Gennadi Bersuker
Random Telegraph Signal noise properties of HfOx RRAM in high resistive state. ESSDERC (2012)
Denis Dondi, Stefano Scorcioni, Alessandro Bertacchini, Luca Larcher, Paolo Pavan
An autonomous wireless sensor network device powered by a RF energy harvesting system. IECON (2012)
Davide Brunelli, Denis Dondi, Alessandro Bertacchini, Luca Larcher, Paolo Pavan, Luca Benini
Photovoltaic scavenging systems: Modeling and optimization. Microelectron. J. 40 (9) (2009)
Fabio Bonizzi, Lucio Sedoni, Davide Sganzerla, Umberto Manzoli, Paolo Pavan
EmbTrack: A Wearable IEEE 802.15.4 Tracking System for Logistics. WCNC (2007)
Denis Dondi, Fabio Bonizzi, Umberto Manzoli, Paolo Pavan
W2TS A novel IEEE 802.11 multi-hop mesh network for tracking systems. MASS (2006)
Luigi Rovati, Matteo Bonaiuti, Paolo Pavan
Design of a high-performance optical system for angular position measurement: optical and electronic strategies for uncertainty reduction. IEEE Trans. Instrum. Meas. 54 (5) (2005)
Luca Larcher, Paolo Pavan, Alfonso Maurelli
Flash Memories for SoC: An Overview on System Constraints and Technology Issues, invited. IWSOC (2005)
Paolo Pavan, Luca Larcher, Massimiliano Cuozzo, Paola Zuliani, Antonino Conte
PROM memory cells for circuit simulations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22 (8) (2003)
Paolo Pavan, Roberto Bez, Piero Olivo, Enrico Zanoni
Flash memory cells-an overview. Proc. IEEE 85 (8) (1997)
Enrico Zanoni, Paolo Pavan
Improving the reliability and safety of automotive electronics. IEEE Micro 13 (1) (1993)