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Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS.

Francesco Maria PuglisiPaolo PavanLuca LarcherAndrea Padovani
Published in: ESSDERC (2014)
Keyphrases
  • information retrieval
  • statistical analysis
  • data sets
  • databases
  • feature selection
  • image processing
  • artificial neural networks