A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs.
Sara VecchiPaolo PavanFrancesco Maria PuglisiPublished in: IRPS (2023)
Keyphrases
- random noise
- artificial intelligence
- computational complexity
- multiresolution
- increase in computational complexity
- worst case
- noise level
- noise reduction
- noisy data
- noisy environments
- noise model
- additive noise
- noise removal
- memory requirements
- databases
- decision problems
- input data
- social networks
- genetic algorithm
- neural network