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Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs.

Marcello CioniAlessandro BertacchiniAlessandro MucciGiovanni VerzellesiPaolo PavanAlessandro Chini
Published in: IRPS (2021)
Keyphrases
  • concept drift
  • case study
  • pattern recognition
  • training data
  • relational databases
  • low voltage
  • data mining
  • learning algorithm
  • database systems
  • similarity measure
  • data streams
  • low cost