Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.
Nicolò ZagniAlessandro ChiniFrancesco Maria PuglisiPaolo PavanMatteo MeneghiniGaudenzio MeneghessoEnrico ZanoniGiovanni VerzellesiPublished in: IRPS (2020)