AUTOMATIC INSPECTION
Experts
- Masatoshi Ishikawa
- Akio Namiki
- Emanuele Menegatti
- Yuji Yamakawa
- Idaku Ishii
- Oleg Sergiyenko
- Wendy Flores-Fuentes
- Shigang Yue
- Karsten Berns
- Zhigang Zhu
- Kolja Kühnlenz
- Lars Lindner
- Stephen Pollard
- Yoichiro Maeda
- Roberto Antonio Vázquez
- Takeshi Takaki
- Fumio Miyazaki
- Marc D. Winterbottom
- Tatsuo Arai
- Toshio Fukuda
- Yoshihiro Fujita
- Lawrence G. Votta
- Julio C. Rodríguez-Quiñonez
- Rüdiger Dillmann
- Hiroshi Ishiguro
- Luciane B. Soares
- Enrico Pagello
- Alex Pentland
- Georg Hartmann
- Nobuyuki Yamashita
- Yoshihiro Nakabo
- Cheng Hu
- Beatriz A. Garro
- Maristella Matera
- Fumiaki Tomita
- Sergey M. Sokolov
- Jizhong Xiao
- Tetsuya Yagi
- Guangyou Xu
Venues
- ICRA
- IROS
- Sensors
- CoRR
- MVA
- IEEE Trans. Instrum. Meas.
- Mach. Vis. Appl.
- RoboCup
- ICVS
- ROBIO
- IJCAI
- ICPR
- Ind. Robot
- IEEE Trans. Ind. Electron.
- IEEE Access
- J. Robotics Mechatronics
- Image Vis. Comput.
- ISCAS
- ICARCV
- J. Electronic Imaging
- Int. J. Pattern Recognit. Artif. Intell.
- Multim. Tools Appl.
- Comput. Electron. Agric.
- WACV
- Robotics Auton. Syst.
- J. Sensors
- CVPR Workshops
- IEEE Trans. Intell. Transp. Syst.
- CASE
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Remote. Sens.
- J. Intell. Robotic Syst.
- Comput. Ind. Eng.
- Comput. Ind.
- BMVC
- J. Intell. Manuf.
- Reliab. Eng. Syst. Saf.
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