AUTOMATIC INSPECTION
Experts
- Masatoshi Ishikawa
- Akio Namiki
- Yuji Yamakawa
- Idaku Ishii
- Emanuele Menegatti
- Oleg Sergiyenko
- Shigang Yue
- Yoichiro Maeda
- Wendy Flores-Fuentes
- Karsten Berns
- Kolja Kühnlenz
- Zhigang Zhu
- Stephen Pollard
- Lars Lindner
- Marc D. Winterbottom
- Enrico Pagello
- Fumio Miyazaki
- Shin'ichiro Okazaki
- Rüdiger Dillmann
- Fumiaki Tomita
- Hiroshi Ishiguro
- Georg Hartmann
- Luciane B. Soares
- Yoshihiro Fujita
- Maristella Matera
- Lawrence G. Votta
- Tetsuya Yagi
- Roberto Antonio Vázquez
- Nobuyuki Yamashita
- Roland Siegwart
- Beatriz A. Garro
- Toshio Fukuda
- Guangyou Xu
- Jizhong Xiao
- Julio C. Rodríguez-Quiñonez
- Tatsuo Arai
- Takeshi Takaki
- Yoshihiro Nakabo
- Cheng Hu
Venues
- ICRA
- IROS
- Sensors
- CoRR
- MVA
- IEEE Trans. Instrum. Meas.
- Mach. Vis. Appl.
- RoboCup
- ROBIO
- ICVS
- IEEE Trans. Ind. Electron.
- ICPR
- Ind. Robot
- IJCAI
- J. Robotics Mechatronics
- Image Vis. Comput.
- IEEE Access
- J. Electronic Imaging
- ICARCV
- Int. J. Pattern Recognit. Artif. Intell.
- ISCAS
- WACV
- Comput. Electron. Agric.
- Multim. Tools Appl.
- IEEE Trans. Intell. Transp. Syst.
- J. Sensors
- Robotics Auton. Syst.
- CASE
- J. Intell. Robotic Syst.
- Remote. Sens.
- CVPR Workshops
- J. Field Robotics
- SMC
- BMVC
- IECON
- ITSC
- Comput. Ind.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Ind. Eng.
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