FLIGHT TEST
Experts
- Enmin Feng
- Paul M. J. Van den Hof
- Guy Albert Dumont
- Michel Verhaegen
- Ian Postlethwaite
- Liang Yin
- Zhilong Xiu
- Xiaowei Liu
- Raquel Urtasun
- Olympia Roeva
- Mo-Yuen Chow
- Habiballah Rahimi-Eichi
- Rogelio Lozano
- Yasuyuki Funahashi
- Lincheng Shen
- Melvin D. Montemerlo
- Jan-Willem van Wingerden
- Masayoshi Tomizuka
- Rodrigo Ventura
- Hossam S. Abbas
- Jing Na
- Stefano Perna
- Tania Pencheva
- HÃ¥kan Hjalmarsson
- Yuwen Xiong
- John Mark Ansermino
- Jin Tian
- Hicham Chaoui
- Eric Feron
- Weiping Chen
- Brian D. O. Anderson
- Datong Liu
- Marco Lovera
- Peter I. Corke
- Ruben Garrido
- Fred Y. Hadaegh
- Sivabalan Manivasagam
- Kostas Alexis
- Guanbin Gao
Venues
- CoRR
- CDC
- ACC
- Autom.
- Sensors
- ICRA
- IEEE Access
- IEEE Trans. Ind. Electron.
- ECC
- IROS
- IECON
- IGARSS
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Autom. Control.
- ISCAS
- Remote. Sens.
- Appl. Soft Comput.
- IEEE Trans. Biomed. Eng.
- J. Aerosp. Inf. Syst.
- CCTA
- Int. J. Model. Identif. Control.
- J. Frankl. Inst.
- J. Intell. Robotic Syst.
- EMBC
- IEEE Trans. Intell. Transp. Syst.
- Biomed. Signal Process. Control.
- CDC/ECC
- MED
- Appl. Math. Comput.
- NER
- Comput. Chem. Eng.
- IEEE Robotics Autom. Lett.
- ICCA
- SMC
- ROBIO
- PIMRC
- ITSC
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