FLIGHT TEST
Experts
- Enmin Feng
- Paul M. J. Van den Hof
- Guy Albert Dumont
- Mo-Yuen Chow
- Michel Verhaegen
- Raquel Urtasun
- Zhilong Xiu
- Rogelio Lozano
- Ian Postlethwaite
- Liang Yin
- Olympia Roeva
- Habiballah Rahimi-Eichi
- Xiaowei Liu
- S. N. Omkar
- Mykel J. Kochenderfer
- Yasuyuki Funahashi
- John Lygeros
- John Mark Ansermino
- Piotr Kulczycki
- Christos Papachristos
- Paolo Berardino
- Federico Baronti
- Jin Tian
- H. Jin Kim
- Sivabalan Manivasagam
- Guanbin Gao
- Anthony Tzes
- Jingkang Wang
- Malgorzata Charytanowicz
- Stefano Perna
- Lincheng Shen
- Yuwen Xiong
- Andrew Y. Ng
- Kostas Alexis
- Tarek Hamel
- Hossam S. Abbas
- Jing Na
- Håkan Hjalmarsson
- Andreas Rauh
Venues
- CoRR
- CDC
- ACC
- Autom.
- Sensors
- ICRA
- IEEE Access
- IEEE Trans. Ind. Electron.
- ECC
- IECON
- IROS
- IGARSS
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Autom. Control.
- ISCAS
- Remote. Sens.
- Appl. Soft Comput.
- IEEE Trans. Biomed. Eng.
- J. Aerosp. Inf. Syst.
- J. Frankl. Inst.
- J. Intell. Robotic Syst.
- EMBC
- CCTA
- Int. J. Model. Identif. Control.
- Appl. Math. Comput.
- Biomed. Signal Process. Control.
- MED
- IEEE Trans. Intell. Transp. Syst.
- NER
- CDC/ECC
- ICCA
- ROBIO
- PIMRC
- Comput. Chem. Eng.
- SMC
- ITSC
- IEEE Robotics Autom. Lett.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend