Chang-Chih Chen

Publication Activity (10 Years)

Years Active: 2012-2022
Publications (10 Years): 6

Top Topics

Reliability Analysis

Random Access Memory

Hypothesis Test

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Microelectron. Reliab.

Publications

Chang-Chih Chen, Chia-Chien Chang, Edward W. Sun, Min-Teh Yu
Optimal decision of dynamic wealth allocation with life insurance for mitigating health risk under market incompleteness. Eur. J. Oper. Res. 300 (2) (2022)
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28 (3) (2020)
Taizhi Liu, Chang-Chih Chen, Linda Milor
Comprehensive Reliability-Aware Statistical Timing Analysis Using a Unified Gate-Delay Model for Microprocessors. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Chang-Chih Chen, Taizhi Liu, Linda Milor
System-Level Modeling of Microprocessor Reliability Degradation Due to Bias Temperature Instability and Hot Carrier Injection. IEEE Trans. Very Large Scale Integr. Syst. 24 (8) (2016)
Taizhi Liu, Chang-Chih Chen, Jiadong Wu, Linda S. Milor
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection. ICCD (2016)
Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor
Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array. IEEE Trans. Very Large Scale Integr. Syst. 24 (7) (2016)
Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55 (9-10) (2015)
Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor
Estimation of remaining life using embedded SRAM for wearout parameter extraction. IWASI (2015)
Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39 (8) (2015)
Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. VTS (2015)
Chang-Chih Chen, Linda S. Milor
Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms. IEEE Trans. Very Large Scale Integr. Syst. 23 (10) (2015)
Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55 (9-10) (2015)
Taizhi Liu, Chang-Chih Chen, Linda S. Milor
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines. ISQED (2015)
Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim
Simulation of system backend dielectric reliability. Microelectron. J. 45 (10) (2014)
Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor
Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. VTS (2014)
Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, Sung Kyu Lim
Backend Dielectric Reliability Full Chip Simulator. IEEE Trans. Very Large Scale Integr. Syst. 22 (8) (2014)
Chang-Chih Chen, Linda Milor
System-level modeling and microprocessor reliability analysis for backend wearout mechanisms. DATE (2013)
Chang-Chih Chen, Linda Milor
System-level modeling and reliability analysis of microprocessor systems. IWASI (2013)
Chang-Chih Chen, Fahad Ahmed, Linda Milor
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis. Microelectron. Reliab. 53 (9-11) (2013)
Chang-Chih Chen, Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim, Linda Milor
Backend dielectric reliability simulator for microprocessor system. Microelectron. Reliab. 52 (9-10) (2012)
Chang-Chih Chen, Fahad Ahmed, Linda Milor
A comparative study of wearout mechanisms in state-of-art microprocessors. ICCD (2012)