Kexin Yang

Publication Activity (10 Years)

Years Active: 2017-2022
Publications (10 Years): 15

Top Topics

Reliability Analysis

Parameters Estimation

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Microelectron. Reliab.

Publications

Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (9) (2022)
Rui Zhang, Kexin Yang, Zhaocheng Liu, Taizhi Liu, Wenshan Cai, Linda Milor
A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. IEEE Trans. Very Large Scale Integr. Syst. 29 (5) (2021)
Yi-Da Wu, Kexin Yang, Shu-Han Hsu, Linda Milor
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation. IEEE Trans. Very Large Scale Integr. Syst. 28 (12) (2020)
Rui Zhang, Zhaocheng Liu, Kexin Yang, Taizhi Liu, Wenshan Cai, Linda Milor
Inverse Design of FinFET SRAM Cells. IRPS (2020)
Rui Zhang, Taizhi Liu, Kexin Yang, Chang-Chih Chen, Linda Milor
SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. IEEE Trans. Very Large Scale Integr. Syst. 28 (3) (2020)
Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor
Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. IOLTS (2019)
Shu-Han Hsu, Kexin Yang, Linda Milor
Machine Learning for Detection of Competing Wearout Mechanisms. IRPS (2019)
Shu-Han Hsu, Kexin Yang, Linda Milor
Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators. DCIS (2019)
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. IWASI (2019)
Rui Zhang, Kexin Yang, Taizhi Liu, Linda Milor
Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. DCIS (2018)
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. VTS (2018)
Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor
A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 26 (11) (2018)
Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS (2018)
Rui Zhang, Taizhi Liu, Kexin Yang, Linda Milor
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. Microelectron. Reliab. (2017)
Kexin Yang, Taizhi Liu, Rui Zhang, Dae Hyun Kim, Linda Milor
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. Microelectron. Reliab. (2017)